Optical (IL, PDL, RL) photocurrent characterization using swept wavelength technique
CTP10 - Passive optical component testing platform
Overview
Unrivaled passive optical component testing platform for WDM components and photonic integrated circuits
Applications
Spectral characterization of integrated photonic components at sub-picometer resolution
Multiple-output passive optical component testing in manufacturing and R&D
WSS and ROADM calibration and tests
Thin film filters (TFF) characterization
Logging function for transient phenomenon
Spectral characterization using electrical trigger from tunable laser
Highlights
Passive optical component testing
Measure insertion loss (IL), return loss (RL) and polarization-dependent loss (PDL) in seconds with the modular CTP10.
Used with EXFO swept tunable lasers, it supports a wide range of wavelengths and spectral characteristics, with optional direct photocurrent acquisition.
Ideal for large-port-count WDM and PIC characterization.
CTP10 simplifies spectral characterization
One platform performs tunable laser sweep, data collection, processing, trace display and analysis for IL, RL and PDL—helping reduce setup time and complexity.
Hot-swappable modules, external-trigger support and scalable architecture enable fast reconfiguration, laser sharing across up to 8 test stations, and 100+ ports testing with a secondary mainframe.
CTP10 delivers full-speed spectral performance
The CTP10 maintains best-in-class specifications at full speed over the full wavelength range of operation in an integrated setup—well suited to next-generation components such as WSS and ring resonators.
SCAN SYNC provides dynamic wavelength measurement down to 20 fm. OPMx detectors measure >70 dB dynamic range in a single 100 nm/s sweep with 1 pm resolution.
