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Application notes

Application notes
EXFO Exchange: security profile - English (April 16, 2024)
Application notes
EXFO Exchange: security profile - Français (April 16, 2024)
Application notes
Characterization of spectrally fine responses of optical passive devices - English (October 25, 2023)
Application notes
Characterization of spectrally fine responses of optical passive devices - 日本語 (October 25, 2023)
Application notes
Characterization of spectrally fine responses of optical passive devices - 中文 (October 25, 2023)
Application notes
PDL measurement using the CTP10 platform and CT440-PDL - English (March 29, 2023)
Application notes
Automated crosstalk characterization using the CTP10 - English (March 29, 2023)
Application notes
Swept IL PDL measurement of WDM components with the CTP10 platform - English (March 28, 2023)
Application notes
Thin film filters: optical testing with the CTP10 test platform - English (March 27, 2023)
Application notes
Return loss referencing using the CTP-10 test platform - English (March 27, 2023)
Application notes
Insertion loss referencing procedure on the CTP10 test platform - English (March 27, 2023)
Application notes
IL and RL characterization of PM optical components - English (March 27, 2023)
Application notes
OFDR measurement using the CTP10 test platform - English (March 27, 2023)
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