Resources
All resources
Application notes
Programming the CTP10 component test platform - English
(April 11, 2022)
Application notes
Swept IL measurement: Key notions and future-proof solutions - English
(April 23, 2019)
Application notes
Insertion loss referencing procedure on the CTP10 test platform - English
(March 27, 2023)
Application notes
Return loss referencing using the CTP-10 test platform - English
(March 27, 2023)
Reference posters
Testing photonic integrated circuits and passive components - English
(December 17, 2024)
Reference posters
Testing photonic integrated circuits and passive components - 中文
(December 17, 2024)
White papers
Optical component testing in a rapidly evolving 5G world - English
(May 15, 2019)
Brochures and catalogs
Optical testing solutions for manufacturing and R&D - English
(December 23, 2024)
Flyers and pamphlets
Testing photonics and optical components for manufacturing, design and research challenges - English
(June 20, 2023)
Flyers and pamphlets
Testing photonics and optical components for manufacturing, design and research challenges - 中文
(June 20, 2023)
Flyers and pamphlets
Testing photonics and optical components for manufacturing, design and research challenges - 日本語
(June 20, 2023)
Flyers and pamphlets
PIC-Optical integrated circuits test solution - 日本語
(October 26, 2021)
Application notes
Characterization of spectrally fine responses of optical passive devices - English
(October 25, 2023)
Application notes
Characterization of spectrally fine responses of optical passive devices - 日本語
(October 25, 2023)
Application notes
Characterization of spectrally fine responses of optical passive devices - 中文
(October 25, 2023)