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CTP10 - passive optical component testing platform

Unrivaled passive optical component testing platform for WDM components and photonic integrated circuits

Spec sheet (PDF) User manual (PDF)

All products CTP10 - passive optical component testing platform
All products CTP10 - passive optical component testing platform

Key features

  • Industry’s fastest swept wavelength measurements of insertion loss (IL), return loss (RL) or polarization dependent loss (PDL) Read more
  • Insertion loss characterization >70 dB in a single scan at full speed
  • ±5 pm wavelength accuracy and 1 pm sampling resolution at full speed
  • Accurate measurement of devices with high spectral contrast with slopes up to 10dB/pm (10 000 dB/nm)
  • Flexible architecture with automation, laser sharing and daisy chaining functionalities
  • Powerful and intuitive graphical user interface (GUI) for easy test configuration and measurement analysis


  • PIC wafer-level testing
  • Multiple-output passive optical component testing in manufacturing and R&D
  • WSS and ROADM calibration and tests
  • Thin film filters (TFF) characterization


The CTP10 is a modular measurement platform for efficient 24/7 testing of passive components. It lets you perform insertion loss (IL), polarization dependent loss (PDL) or return loss (RL) measurements with an unprecedented dynamic range, speed and resolution. The CTP10 is the ideal instrument for the characterization of a new breed of optical devices with large port-count found in high-speed WDM networks and photonic integrated circuits (PIC). It operates together with the T100S-HP series of swept tunable laser to perform IL-RL or IL-PDL measurements within seconds.

Next-gen platform and modules

The CTP10 platform hosts up to 10 hot-swappable modules, including a choice of key modules for spectral characterization (IL RL OPM2 or IL PDL module), wavelength control modules (SCAN SYNC and FBC module) and detection modules (OPMx module). Those fully integrated modules are hot-swappable to greatly reduce setup time and provide a flexible and evolutive test solution.

The CTP10 has an embedded operating system for handling and processing large amounts of data. It also offers a scalable architecture by sharing one or several tunable lasers among up to 8 test stations and by adding a secondary mainframe for 100+ ports testing.

Unparalleled performance

The CTP10 yields the fastest swept IL RL or PDL spectral measurements in the industry. It offers uncompromising performance and maintains best-in-class specifications at full speed. The range-free series of OPMx optical detectors can measure a dynamic range of >70 dB in a single sweep at 100 nm/s, with a 1-pm resolution, drastically increasing throughput in manufacturing and R&D. The OPMx detectors can also accurately measure extremely sharp spectral features of up to 10 dB/pm (10,000 dB/nm), making the CTP10 future-proof to measure next generation components such as wavelength selective switches (WSS) or ring-resonators.

Powerful intuitive GUI

The CTP10 has been developed around three key principles: integration, performance and automation. Its embedded software offers a powerful and intuitive GUI, simplifying test configuration and measurement. The CTP10 seamlessly controls external tunable laser(s) to let you focus on what really matters: measurement data and analysis. The GUI integrates a full suite of tools to analyze pass-band (e.g., WDM or WSS) and stop-band filters.

CTP10 - passive optical component testing platform

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Innovation and leadership have always been front and center at EXFO. Each year, we strive to develop solutions that will ensure superior customer experience in smarter, modern networks. Being recognized as such is always a great honor. Learn more about our awards:

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