en

Ce produit n'est pas disponible pour la vente au Québec.

A B C D E F G H I J K L M N O P Q R S T U V W X Y Z 0-9
  • EN

CTP10 - Passive optical component testing platform

Unrivaled passive optical component testing platform for WDM components and photonic integrated circuits

Spec sheet (PDF) User manual (PDF)

All products CTP10 - Passive optical component testing platform
All products CTP10 - Passive optical component testing platform

Key features

  • Optical (IL, PDL, RL) & photocurrent characterization using swept wavelength technique​
  • Industry-first full-band PDL measurement from 1260 to 1620 nm
  • Unique mix of high dynamic range, accuracy, resolution and test speed​
  • Integrated solution with embedded GUI and built-in analysis​
  • Full automation via SCPI commands
  • Scalable architecture for R&D and manufacturing environments

Applications

Description

The CTP10 is a modular passive optical component testing platform that combines speed, accuracy and flexibility. It offers reliable high-quality insertion loss (IL), return loss (RL) or polarization-dependent loss (PDL) measurement regardless of wavelength range or spectral characteristics of the device under test. It operates together with EXFO’s series of swept tunable lasers to perform these measurements within seconds and can be configured to acquire photocurrent measurements directly from external photodiodes.

Thanks to its modular configuration, it is the ideal instrument to characterize large port count components used in WDM networks and photonic integrated circuits (PIC).

Next-gen platform and modules

Thanks to its innovative approach, the CTP10 also greatly reduces setup time and simplifies spectral characterization by taking care of many complex operations. Indeed, tunable laser sweep, data collection and processing for IL, RL or PDL, trace display and analysis are all performed from a single instrument.

The CTP10 platform is compatible with a selection of key modules for spectral characterization (IL PDL & IL PDL OPM2 modules or IL RL OPM2), wavelength control (SCAN SYNC and FBC modules), optical detection (OPMx module) and photocurrent meters (PCMx module). These fully integrated modules are hot-swappable and quickly reconfigurable to greatly reduce setup time and provide a flexible and evolutive test solution.

The CTP10 has an embedded operating system for handling and processing large amounts of data. It also offers a scalable architecture by sharing one or several tunable lasers among up to 8 test stations and by adding a secondary mainframe for 100+ ports testing.

Unparalleled performance

The CTP10 offers uncompromising performance and maintains best-in-class specifications at full speed over the full wavelength range of operation with an integrated setup. This combination of speed, accuracy, integration and spectral coverage is unprecedented on the market and ideal as a future-proof testing solution on next generation components such as wavelength selective switches (WSS) or ring-resonators.

The range-free series of OPMx optical detectors can measure a dynamic range of >70 dB in a single sweep at 100 nm/s with 1 pm resolution. This ability substantially increases manufacturing and R&D throughput. OPMx detectors can also accurately measure extremely sharp spectral features of up to 10 dB/pm (10,000 dB/nm). PCMx photocurrent meters perform equally well when performing tasks such as measuring large current fluctuations coming from PIC-embedded photodiodes.

Powerful intuitive GUI

The CTP10 has been developed around three key principles: integration, performance and automation. Its embedded software offers a powerful and intuitive GUI that seamlessly controls the measurement process to let you focus on what really matters: measurement data and analysis. Additionally, the CTP10 offers full remote control via SCPI‑compatible commands.

CTP10 - Passive optical component testing platform

Interested in this product?

  • Request a quote

Awards and reviews

Innovation and leadership have always been front and center at EXFO. Each year, we strive to develop solutions that will ensure superior customer experience in smarter, modern networks. Being recognized as such is always a great honor. Learn more about our awards:

Judge

"Highly accurate and automated measurements of insertion loss and PDL from 1240 nm to 1680 nm with powerful data processing significantly shortens testing time."

Advanced module in passive optical component testing platform

Let's stay in touch!

Get the latest network test, monitoring and analytics news!

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Thank you.