When you’re ready to start your day, you want to get it started quickly. The FTB-500 enables you to expedite the setup process and get testing quickly so that you can get to your next location faster and breeze through your tight schedule.
With massive processing power and mix-and-match flexibility, the FTB-500 platform is right out of a multi-application wonderland. It brings you new, highly advanced applications and pushes your current ones’ efficiency to new heights. So go ahead: break new ground, set new test performance standards, tame new technologies. Benefit from an all-in-one platform that you can build around your most unique requirements.
Single-ended, span-by-span measurement of PMD, enabling targeted fiber upgrades and cost-effective deployment of 10, 40 and 100 Gbit/s transmission.
PMD, CD and OTDR testing combined in a single solution, for in-depth fiber characterization. Run FastReporter post-processing software while performing your acquisitions, for faster data analysis and report generation—directly on-site.
The most advanced hardware, ready for future 100 Gbit/s applications.
Integrated optical and transport testing in a portable solution supporting OC-768, STM-256, OTU3 as well as true in-band OSNR for ROADMs, 40G transmission and UDWDM signals.
All-in-one transport and datacom configuration supporting:
Integrates two metro/CWDM OTDRs and a high-power—up to 23 dBm—optical spectrum analyzer (with built-in polarization controller) into a single portable solution.
The FTB-500 houses any of EXFO’s FTB plug-and-play modules, enabling you to reconfigure your test solution as your test needs evolve. Combine physical and optical characterization applications with transport and datacom test modules covering next-generation 10G, 40G and 100G analysis.
The innovative Test Data Manager (TDM) application centralizes the test results generated on EXFO test instruments, thereby functioning as a repository for all test results, and provides access to view any test result as well as create custom reports based on the stored test data.