Resources
All resources
Application notes
Insertion loss and return loss: relative measurements using the CTP10 platform - English
(March 27, 2023)
Application notes
Swept IL PDL measurement of WDM components with the CTP10 platform - English
(March 28, 2023)
White papers
Navigating the murky waters of swept PDL measurements - English
(February 25, 2021)
Flyers and pamphlets
Optiwave and EXFO - Partners for automation in lab and manufacturing - English
(September 30, 2022)
Product demos
An overview of EXFO Optics product portfolio - English
(May 18, 2023)
Product demos
EXFO's CTP10: Overview of the GUI for swept IL-PDL measurements - English
(May 18, 2023)
Product demos
Is your optical component testing future-proof? - English
(May 18, 2023)
Promotional videos
Accelerating photonics lab to fab with Aerotech, EHVA and EXFO - English
(May 18, 2023)
Promotional videos
Automated wafer-level testing of photonic integrated circuits - English
(May 18, 2023)
Brochures and catalogs
Optical testing solutions for universities and labs - English
(December 23, 2024)