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This application note explains how a multimode light source with controlled launch conditions ensures accuracy, reproducibility and consistent loss readings.

This application note explains why it is important to test for chromatic dispersion and polarization mode dispersion, especially with the penetration of 40 Gbit/s, or OC-768/STM-256.

This application note explores ODU0/ODUflex as their implementations in the OTN technology are key enhancements in the transport network.

This article provides an overview of EXFO's AXS-200/600 copper family testers, designed to deploy advanced, high-rate, triple-play services in a competitive and cost-constrained environment.

This article reviews the basics of light-emitting diodes (LEDs)—whether they are edge-emitting (EELED), surfaceemitting, or super-luminescent diodes (SLEDs)—in test and measurement applications.

This article defines the terms VLAN and Q in Q; it describes their benefits and provides concrete examples of how Q in Q and VLANs are used.

This article presents the various applications and advantages of vertical-cavity surface-emitting lasers.

This article presents the DFL-5720, a practical instrument that can serve wavelength-locker manufacturers and designers due to its ability to support just about any locking configuration.

This article presents the key factors to take into consideration when performing successful spectral analysis.

This application note presents how you can verify that your network is synchronized and what are the consequences if it is not.