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This application note examines the need for a centralized test point, as well as the characteristics and applications of a centralized Ethernet test head.

This application note explains some important TDR aspects that all TDR users should be familiar with.

This article provides an overview of EXFO's AXS-200/600 copper family testers, designed to deploy advanced, high-rate, triple-play services in a competitive and cost-constrained environment.

This article explains how we can extend the application of a piezo-electric solution switcher through the integration of the hardware and software elements to satisfy experimental needs, going beyond ...

This article explains the importance of understanding the specific sources of mechanical drift and subsequent corrective action that needs to be taken to minimize pipette drift for patch clamp recordi...

This article explains the importance to understand how nanoposition and alignment come together, to become successful in process development.

This article presents one method to create .NET scripts in order to maximize your efficiency when testing with the EXFO’s transport and datacom test modules.

This technical note provides some experimental results and a few design rules to adequately address the Raman scattering problem.

This application note introduces an exact analysis, based on the fundamentals of the standard method, but using a slightly modified setup, largely extending the application domain of the interferometr...

This application note presents how to ensure that Ethernet links are ready for the high-quality services customers are demanding and how to turn SLAs into sales tools that help service providers attra...