Skip to main content

Search results


How to take an adapter cord reference

Watch this 2 minutes video to learn everything about taking an adaptor cord reference with the PXM/LXM for base-24 fiber OLTS testing.

Resources
How-to perform rapid base-24 testing

Watch this 1 min video to learn everything about performing a rapid base-24 testing.

Resources
How to manage data for base-24 testing with the PXM/LXM

Watch this 2 minutes video to learn everything about onboarding job management and using FastReporter to combine data files for base-24 testing with the PXM/LXM.

Resources
Verwaltung von Glasfasernetzen während ihres gesamten Lebenszyklus: die Rolle der Fernprüfung und -kontrolle von Glasfasern

Indem RFTM von Anfang an in jede Lebenszyklusphase integriert wird, lassen sich eine Vielzahl von Vorteilen erschließen: schnellere Erstellung und Monetarisierung, höhere Qualitätsstandards und gering...

Resources
Troubleshooting PIM

Test and Measurement Forum 2024 brought to you by RCR Wireless News Verizon’s Associate Fellow Dennis McColl and EXFO’s test expert Danny Sleiman will be digging in their deep experience to share views and insight on RF interference that impact wireless networks, particularly passive intermodulation (PIM).  Catch this 30-minute discussion to learn about improved processes for conquering PIM, enhancing network performance and much more! PRESENTATION AND DISCUSSION Troubleshooting PIM: As network demands grow with increased data throughput and traffic, how can we improve and solve interference issues? Overcoming challenges of managing all the frequencies Operational PIM versus worst case scenario PIM Exploring site design - PIM friendly design components OPEX considerations when combatting PIM and network performance PIM hunting and mitigation best practice Carrier relations - trust and cooperation between parties to identify interference Resources : Success story : How a 5G operator quickly isolated and resolved RF interference issues Flyer : Quickly mitigate PIM and RF interference for faster time to revenue  

Resources
T200S/T500S Resources
Introducing the OPAL-MD, probe station for multi-die testing

Swift and reliable yields in photonic integrated circuits from lab-to-fab and fab-to-live entails cutting-edge advances in testing technologies. This video overviews the OPAL-MD and its wide range of leading capabilities as a dedicated probe station for testing multiple dies.

Resources
AXS 115 Pages
STAC 2024 Corporate
OPAL-MD – Multi-die test station

Accurate, automated, fast and cost-effective testing of photonic integrated circuits (PIC) with traceable results.

Resources