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Variable attenuators are an integral part of most BER testing and EDFA characterization setups. All of EXFO's modular (IQS line) and benchtop variable attenuators are built for top performance and utmost accuracy with distinct sets of features and specifications to suit various testing needs.

Entry-level, flexible, cost-effective and upgradeable. Automated optical alignment and test of photonic integrated circuits (PIC) with traceable results that can be queried. Manual positioning of die and electrical probes.

Our test stations incorporate top-of-the-line equipment to ensure that requirements are met, whatever the situation. Build the best suited station for you, whether you're testing individual chips for R&D or even full production wafers. EXFO’s adaptative test stations can handle any scenario, from individual chips to full production wafers when it comes to photonic integrated circuits (PIC). Equip your station with RF probes, optical heads or any other equipment, as needed.

The fastest sampling scope in the industry supporting 28G NRZ signals.

The module compliance board (MCB) enables the serial communication between the bit error rate (BER) tester and the optical transceiver.

Efficient CDR solution for the production line.

All-in-one solution to transceiver mass production with integration of bit error rate tester, module compliance board (MCB) and power supply

Electrical BER tester supporting NRZ and PAM4 coding, with advanced FEC tools and with testing capabilities up to 800G.