Application notes
Tunable DFB Laser Sources: The Right Choice for EDFA and System Level Testing - English
(August 22, 2011)
Application notes
Tunable DFB Laser Sources: The Right Choice for EDFA and System Level Testing - 中文
(August 22, 2011)
Application notes
Power Meter Calibration at EXFO - English
(August 22, 2011)
Application notes
Power Meter Calibration at EXFO - 中文
(August 22, 2011)
Discontinued spec sheets
ARU-100 HPNA Test Probe - English
(August 22, 2011)
Discontinued spec sheets
ARU-100 HPNA Test Probe - 中文
(August 22, 2011)
Discontinued spec sheets
ARU-100 HPNA Test Probe - Español
(August 22, 2011)
Discontinued spec sheets
ARU-100 HPNA Test Probe - Deutsch
(August 22, 2011)
Application notes
Reconfigurable Optical Add/Drop Multiplexers—Testing Issues - English
(August 21, 2011)
Application notes
Wavelength Meter Theory: Michelson Interferometry - English
(August 21, 2011)
Application notes
A New Test Method for the Quantitative Determination of BAD PMD Sections Along an Installed Fiber Link - English
(August 21, 2011)
Application notes
Automated Pivot Point Location for Optical Component Manufacturing - English
(August 21, 2011)
Application notes
RFTS Integration into an Existing Geographical Information System - English
(August 21, 2011)
Application notes
Single-Ended Data-Rate Prediction for the AXS-200/600 Copper Family - English
(August 21, 2011)
Application notes
Interpreting the Elevation Following a Reflective Event on an OTDR Measurement - English
(August 21, 2011)