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This article introduces the EXFO Radiometer, which drastically reduces the measurement inaccuracies caused by filter transmission limitations and the effects of measurement geometry found in other rad...

This article shows the importance of relying on network/component test equipment featuring a built-in signal-conditioning tool to identify issues and validate the design of components in order to opti...

This application note examines the need for a centralized test point, as well as the characteristics and applications of a centralized Ethernet test head.

This application note presents how you can verify that your network is synchronized and what are the consequences if it is not.

This application note explains some important TDR aspects that all TDR users should be familiar with.

This article provides an overview of EXFO's AXS-200/600 copper family testers, designed to deploy advanced, high-rate, triple-play services in a competitive and cost-constrained environment.

This article presents the DFL-5720, a practical instrument that can serve wavelength-locker manufacturers and designers due to its ability to support just about any locking configuration.

This article presents the various applications and advantages of vertical-cavity surface-emitting lasers.

This article presents the key factors to take into consideration when performing successful spectral analysis.

This article reviews the basics of light-emitting diodes (LEDs)—whether they are edge-emitting (EELED), surfaceemitting, or super-luminescent diodes (SLEDs)—in test and measurement applications.