Skip to main content

Search results


Pipette Drift Sources and Solutions for Patch Clamp Recording Experiments

This article explains the importance of understanding the specific sources of mechanical drift and subsequent corrective action that needs to be taken to minimize pipette drift for patch clamp recordi...

Resources
Seeing the Light in Photonics Manufacturing - Gaining Expertise in Nano-Alignment

This article explains the importance to understand how nanoposition and alignment come together, to become successful in process development.

Resources
Out-of-Band Testing for Carrier-Class Ethernet: A Cost-Effective Solution for Increasing QoS

This application note compares a traditional and complex test method that uses transmission wavelengths to an innovative and simple test solution that uses a filtered out-of-band wavelength.

Resources
Why Test for Chromatic Dispersion and Polarization Mode Dispersion

This application note explains why it is important to test for chromatic dispersion and polarization mode dispersion, especially with the penetration of 40 Gbit/s, or OC-768/STM-256.

Resources
Fiber Inspection Probes vs. Fiber-Optic Microscopes

This application note covers the differences between fiber inspection probes and fiber-optic microscopes, two instruments used to inspect connectors.

Resources
Using Media Delivery Index on the FTB-8510B Packet Blazer™ Ethernet Test Module (IPTV Option)

This application note provides an overview of the IPTV testing option of the FTB-8510B, to monitor the critical points in the network.

Resources
Ensuring IPTV Service Quality While Migrating to MPEG4 and HDTV

This application note presents the key elements to consider when upgrading networks to higher-rate DSL technologies or implementing MPEG4 video encoding.

Resources
The ROADM Challenge and the In-Band OSNR Solution

This application note presents in-band OSNR measuring techniques become essential to accurately measure the OSNR in reconfigurable networks.

Resources
Digital Multimeter: The Dirty Dozen

This application note describes the dirty dozen electrical measurements used to determine the basic quality of a circuit.

Resources
IQS-12008 All-Band Component Analyzer System: Accurate and Reliable Measurements Across the Bands

This application note explains many of the important details and design parameters that allow the IQS-12008 to attain performance objectives; it also discusses wavelength and loss measurement accuracy...

Resources