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This article presents a principle that could be applied a new generation of “non-intrusive” clip-on instruments for signal monitoring or power measurement.

This article demystifies how EXFO's optical calibration system can guide you through the calibration of power meters, covering issues such as traceability and technical characteristics of detectors.

This article reviews the basics of light-emitting diodes (LEDs)—whether they are edge-emitting (EELED), surfaceemitting, or super-luminescent diodes (SLEDs)—in test and measurement applications.

This article defines the terms VLAN and Q in Q; it describes their benefits and provides concrete examples of how Q in Q and VLANs are used.

This article presents the principles behind the 2600B series tunable laser sources and describes simple user calibration procedures to maintain optimum source performance.

This article explains how EXFO’s DFL-5720 Digital Frequency-Locking System can simplify the implementation of a closed-loop process required for blocking a test laser frequency to perform alignments, ...

This article presents the DFL-5720, a practical instrument that can serve wavelength-locker manufacturers and designers due to its ability to support just about any locking configuration.

This article demonstrates how optimizing and controlling the UV curing process are essential in the manufacturing of reliable medical devices.

This application note presents the FTB-5500B PMD Analyzer, based on the generalized interferometric method, allowing you to test whole links in one test sequence.

This article presents the key factors to take into consideration when performing successful spectral analysis.