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ARU-100 HPNA Test Probe

The ARU-100 helps evaluate HPNA networks for impairments and their ability to support triple-play services delivered by FTTx networks.

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Fast and Easy Programming with the IQS-500 Intelligent Test System: PDL as a Function of Wavelength

This article gives a typical example of a Microsoft Visual Basic program, designed to control EXFO’s tunable laser source and PDL meter to measure a component’s PDL as a function of wavelength.

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Tunable DFB Laser Sources: The Right Choice for EDFA and System Level Testing

This article reviews the critical parameters of TLS applicable to EDFA and system testing; it also examines the performance characteristics of a tunable DFB laser source.

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Power Meter Calibration at EXFO

This technical note provides an overview of EXFO's fully qualified and automated in-house power meter calibration system (EPMCS).

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A New Test Method for the Quantitative Determination of BAD PMD Sections Along an Installed Fiber Link

This technical note introduces a novel measurement method using a tunable random-scrambling POTDR (RS-POTDR).

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Automated Pivot Point Location for Optical Component Manufacturing

This article presents EXFO's unique automated method for accurately determining the optimum pivot point to facilitate pigtailing and/or test and measurement applications of arrayed devices.

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RFTS Integration into an Existing Geographical Information System

This article explains the benefits of integration an RFTS into an existing GIS database.

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2600B Series Tunable Laser Sources: Wavelength Uncertainty and User Calibration Procedures

This article presents the principles behind the 2600B series tunable laser sources and describes simple user calibration procedures to maintain optimum source performance.

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Ensuring the Availability and Reliability of Dark-Fiber Networks

This article explains how EXFO’s DFL-5720 Digital Frequency-Locking System can simplify the implementation of a closed-loop process required for blocking a test laser frequency to perform alignments, ...

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DFL-5720 Digital Frequency-Locking System: Simplifying Wavelength-Locker Testing

This article presents the DFL-5720, a practical instrument that can serve wavelength-locker manufacturers and designers due to its ability to support just about any locking configuration.

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