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Laser Spectral Analysis Made Easy

This article describes the components that make up a laser spectrum analyzer, as well as the technology designed into them.

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Digital Multimeter: The Dirty Dozen

This application note describes the dirty dozen electrical measurements used to determine the basic quality of a circuit.

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Active Ethernet: Frequently Asked Questions

This application note presents an overview of Ethernet.

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2600B Series Tunable Laser Sources: Wavelength Uncertainty and User Calibration Procedures

This article presents the principles behind the 2600B series tunable laser sources and describes simple user calibration procedures to maintain optimum source performance.

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Ensuring the Availability and Reliability of Dark-Fiber Networks

This article explains how EXFO’s DFL-5720 Digital Frequency-Locking System can simplify the implementation of a closed-loop process required for blocking a test laser frequency to perform alignments, ...

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Automated Pivot Point Location for Optical Component Manufacturing

This article presents EXFO's unique automated method for accurately determining the optimum pivot point to facilitate pigtailing and/or test and measurement applications of arrayed devices.

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Non-Intrusive Testing on High Bend Radius Fiber

This article presents EXFO's approach for non-intrusive clip-on fiber monitoring, which allows to address the needs of low insertion-loss requirements of today’s high-speed, multi-wavelength or FTTH s...

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Novel Approach for Non-Intrusive "Clip-On" Fiber Monitoring

This article presents a principle that could be applied a new generation of “non-intrusive” clip-on instruments for signal monitoring or power measurement.

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Provider Backbone Bridge with Traffic Engineering: a Carrier Ethernet Technology Overview

This application note presents PBB-TE and its evolution compared to legacy Ethernet, provides details about its format and suggests some of the testing requirements for the deployment of such networks...

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Characterizing Polarization-Dependent Wavelength in AWGs and PLCs

This application note describes the PDW-parameter evaluation method, based on the first-row elements of the Mueller Matrix.

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