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This article reviews the basics of light-emitting diodes (LEDs)—whether they are edge-emitting (EELED), surfaceemitting, or super-luminescent diodes (SLEDs)—in test and measurement applications.

This article defines the terms VLAN and Q in Q; it describes their benefits and provides concrete examples of how Q in Q and VLANs are used.

This article shows the importance of relying on network/component test equipment featuring a built-in signal-conditioning tool to identify issues and validate the design of components in order to opti...

This application note examines the need for a centralized test point, as well as the characteristics and applications of a centralized Ethernet test head.

This application note presents how you can verify that your network is synchronized and what are the consequences if it is not.

This application note explains some important TDR aspects that all TDR users should be familiar with.

This article explains how we can extend the application of a piezo-electric solution switcher through the integration of the hardware and software elements to satisfy experimental needs, going beyond ...

This article explains the importance of understanding the specific sources of mechanical drift and subsequent corrective action that needs to be taken to minimize pipette drift for patch clamp recordi...

This article explains the importance to understand how nanoposition and alignment come together, to become successful in process development.

This article presents one method to create .NET scripts in order to maximize your efficiency when testing with the EXFO’s transport and datacom test modules.