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T200M: tunable laser for high-volume spectral characterization

Higher data rates and PIC scaling are increasing the pressure to test more devices, across more bands, without driving up cost or complexity.

Designed for high-volume manufacturing, the new T200M continuously tunable laser provides:

  • Streamlined integration with the EXFO CTP10 platform to simplify deployment across multiple test stations.
  • Expanded O-band and CL-band coverage for testing a broader range of optical components and photonic devices.
  • Accurate, repeatable and automated production testing with 0.1 pm wavelength resolution and precision wavelength triggering.
  • Standalone operation through an external PC for engineering validation, process development, production support and research activities.