Technical documentation
Spec sheets, reference guides, white papers. Find all you need to learn more about our test orchestration and real-time 3D analytics solutions.
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Application notes
Wander-A Critical Parameter for Network Synchronization - English
(August 21, 2011)
Application notes
Accurately Measure Laser Spectral Characteristics - English
(August 21, 2011)
Application notes
Reconfigurable Optical Add/Drop Multiplexers—Testing Issues - English
(August 21, 2011)
Application notes
Detailed Ethernet Frame Analysis with EXFO’s EXpertNPA Software - English
(August 21, 2011)
Application notes
Refracted Near-Field Measurements of Refractive Index and Geometry of Silica-on-Silicon Integrated Optical Waveguides - English
(August 21, 2011)
Application notes
Stability Effects on Optical Component Assembly and Measurement Using an Automation System - English
(August 21, 2011)
Application notes
Nanoalignment Know-How: Accuracy Gets You There, Stability Keeps You There - English
(August 21, 2011)
Application notes
Introduction to Nanopositioning Motors - English
(August 21, 2011)
Application notes
DOP Testing Methods for Pump Modules in Raman Application - English
(August 21, 2011)
Application notes
Planar Lightguide Circuits: An Emerging Market for Refractive Index Profile Analysis - English
(August 21, 2011)