Application notes
Tunable DFB Laser Sources: The Right Choice for EDFA and System Level Testing - English
(August 22, 2011)
Application notes
Tunable DFB Laser Sources: The Right Choice for EDFA and System Level Testing - 中文
(August 22, 2011)
Application notes
Power Meter Calibration at EXFO - English
(August 22, 2011)
Application notes
Power Meter Calibration at EXFO - 中文
(August 22, 2011)
Discontinued spec sheets
ARU-100 HPNA Test Probe - English
(August 22, 2011)
Discontinued spec sheets
ARU-100 HPNA Test Probe - 中文
(August 22, 2011)
Discontinued spec sheets
ARU-100 HPNA Test Probe - Español
(August 22, 2011)
Discontinued spec sheets
ARU-100 HPNA Test Probe - Deutsch
(August 22, 2011)
Application notes
Refracted Near-Field Measurements of Refractive Index and Geometry of Silica-on-Silicon Integrated Optical Waveguides - English
(August 21, 2011)
Application notes
Nanoalignment Know-How: Accuracy Gets You There, Stability Keeps You There - English
(August 21, 2011)
Application notes
Stability Effects on Optical Component Assembly and Measurement Using an Automation System - English
(August 21, 2011)
Application notes
Non-Intrusive Testing on High Bend Radius Fiber - English
(August 21, 2011)
Application notes
Polarization of Light in Fiber Causes Signal Dispersion - English
(August 21, 2011)
Application notes
Calibration of Optical Power Meters - English
(August 21, 2011)
Application notes
Polarization and the Patchcord - English
(August 21, 2011)