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This application note explores ODU0/ODUflex as their implementations in the OTN technology are key enhancements in the transport network.

This article provides an overview of EXFO's AXS-200/600 copper family testers, designed to deploy advanced, high-rate, triple-play services in a competitive and cost-constrained environment.

This article presents the DFL-5720, a practical instrument that can serve wavelength-locker manufacturers and designers due to its ability to support just about any locking configuration.

This article presents the various applications and advantages of vertical-cavity surface-emitting lasers.

This article presents the key factors to take into consideration when performing successful spectral analysis.

This article reviews the basics of light-emitting diodes (LEDs)—whether they are edge-emitting (EELED), surfaceemitting, or super-luminescent diodes (SLEDs)—in test and measurement applications.

This article defines the terms VLAN and Q in Q; it describes their benefits and provides concrete examples of how Q in Q and VLANs are used.

This article shows the importance of relying on network/component test equipment featuring a built-in signal-conditioning tool to identify issues and validate the design of components in order to opti...

This application note examines the need for a centralized test point, as well as the characteristics and applications of a centralized Ethernet test head.

This application note presents how you can verify that your network is synchronized and what are the consequences if it is not.