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IQ-FLS-2600 Tunable Laser Sources

Whether you work in R&D, product qualification, or manufacturing, the IQ-2600 and FLS-2600 Tunable Laser Sources offer the performance you need for complete characterization of fiber-optic filters, mu...

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IQ-3300

As part of the IQ family, the IQ-3300 back reflector module integrates advanced testing applications with a simple, easy-to-use graphical user interface. The Windows™ application software ensures a ra...

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IP-to-IP Gateway Test Suite

This IP-to-IP Gateway Test Suite focuses on testing critical functions such as security against theft of service and malicious attacks to ensure the viability of VoIP and IMS services.

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hssFlex Test Suite

The hssFlex Test Suite provides a comprehensive IMS test bed, allowing NEMs and NSPs to perform comprehensive device and end-to-end testing.

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IQS-5100B Polarization Scrambler

Many types of polarization tests require varying the polarization states to cover most of the Poincaré sphere. Perform fast and random changes of the polarization state of a signal with the IQS-5100B ...

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IQS-3200 Return Loss Meter

The IQS-3200 uses a low-drift InGaAs photodetector coupled to a source port and a measurement port. When connected to any stable source (0 dBm output power), it enables measurements down to an impress...

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IQS-3400B PDL/OL Meter

Back up your PDL measurements with the IQS-3400B’s optical return loss (ORL) test function. The IQS-3400B PDL/OL Meter uses the scanning method for simple, flexible component characterization on the p...

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IQS-500 Intelligent Test System

The IQS-500 Intelligent Test System is a scalable system that includes a modular platform, expansion units, remote control and a comprehensive software environment.

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IQS-3100 Variable Attenuator

EXFO’s IQS-3100 Variable Attenuator combines innovative design techniques, high-quality components and meticulous calibration procedure.

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FTB-9100 1x12 Optical Switch Module

The FTB-9100 provides repeatable fiber-to-fiber switching between one common port and 12 input/output ports, for increased measurement efficiency.

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