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OPAL-SD - Single-die automated probe station

Entry-level, flexible, cost-effective and upgradeable. Automated optical alignment and test of photonic integrated circuits (PIC) with traceable results that can be queried. Manual positioning of die and electrical probes.

Products
EA-4000 - Optical and electrical sampling oscilloscope

The fastest sampling scope in the industry supporting 28G NRZ signals.

Discontinued products
MCB - MCB to test next-gen transceivers

The module compliance board (MCB) enables the serial communication between the bit error rate (BER) tester and the optical transceiver.

Products
MCB and loopbacks Products
CD-4000 - Optical and electrical CDR for 28 GBd/56 GBd

Efficient CDR solution for the production line.

Discontinued products
MA-4000 - All-in-one BER tester - MCB for 100G/400G

All-in-one solution to transceiver mass production with integration of bit error rate tester, module compliance board (MCB) and power supply

Discontinued products
Electrical Bit-error-rate testing Products
BA-4000 - Electrical 800G Bit Error Rate Tester

Electrical BER tester supporting NRZ and PAM4 coding, with advanced FEC tools and with testing capabilities up to 800G.

Products
Electrical BER Tester Products
OSICS T100 - External cavity tunable laser module

Stepped external-cavity tunable laser modules that cover all telecom wavelengths

Products
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