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Next-gen, PIC-based transceivers : design, test and validation

Hosted by

Aldo Gutiérrez

Solution Manager

Aldo Gutierrez is Product Line Manager in Manufacturing Design and Research at EXFO. He has more than five years of experience in research and development in the field of optical communications. He has brought his expertise to around 20 international scientific conferences and has also collaborated in more than 15 peer-reviewed articles as author and coauthor. He holds a bachelor's and master's degree in electrical engineering from the National Autonomous University of Mexico and a PhD in physics from the University of Rennes 1. At EXFO, Aldo supports and launches tactical activities related to optical spectrum analyzers, tunable filters, BER testers, optical scopes and 400G transport & datacom solutions.

Photonic integrated circuits (PIC) are the technology currently deployed to tackle the bandwidth stress taking place in the transceiver industry. This stress is due to ever-increasing performance demands and costs pressures experienced by data centers and 5G applications. 

Transceiver vendors need to test and churn out thousands of transceivers per day. To save time during the manufacturing process, while guaranteeing quality, testing solutions must be both extremely fast and reliable. EXFO’s unique end-to-end transceiver testing solution enables the characterization of transceivers on the electrical-side, client-side and optical-side of manufactured units. 
This webcast reviews the current challenges and testing best-practices when designing, manufacturing and validating PIC-based transceivers from 25G to 400G. 

Key takeaways: 

  • What are the current challenges of testing and validating PIC-based transceivers?
  • What are the various compliance tests required for next-gen transceivers, from single components to packaged product?
  •  What solutions does EXFO offer to optimize transceiver qualification?

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