Technical documentation
Spec sheets, reference guides, white papers. Find all you need to learn more about our test orchestration and real-time 3D analytics solutions.
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Application notes
WDM Thin Film Filter - English
(August 21, 2011)
Application notes
PMD Measurement:The EXFO Interferometric Method - English
(August 21, 2011)
Application notes
Infrared Assisted Electronic Subassembly Rework - English
(August 21, 2011)
Application notes
High Power UV Light Sources—When More is Too Much - English
(August 21, 2011)
Application notes
Laser Spectral Analysis Made Easy - English
(August 21, 2011)
Application notes
Testing the Optical Way, or Why Fiber-Optic Characterization Is Best Performed Using Fiber-Optic Testers - English
(August 21, 2011)
Application notes
IQS-12008 All-Band Component Analyzer System: Accurate and Reliable Measurements Across the Bands - English
(August 21, 2011)
Application notes
Setting Up the Packet Blazer When Used in Conjunction with the ADC ENIU - English
(August 21, 2011)
Application notes
Commissioning VoIP over Ethernet - English
(August 21, 2011)
Application notes
Out-of-Band Testing for Carrier-Class Ethernet: A Cost-Effective Solution for Increasing QoS - English
(August 21, 2011)