Skip to main content

Search results


FIP-500 – version 2.6 | Software release notes

Improvements and bug fixes

Support
EX1 gigabit tester | Software release notes

Ability to perform a traceroute test added to EX1 features

Support
FIP-200 Connector Checker Resources
Max-840 Support
Why accurate antenna alignment is crucial in RAN networks Resources
How to boost efficiency with iOLM for distributed taps

Top construction firm of fiber broadband networks builds and documents distributed taps with iOLM for efficiency

Resources
Top construction firm of fiber broadband networks builds and documents distributed taps with iOLM for efficiency Resources
Let your PIC shine: Advanced characterization for integrated photonics

Watch this webinar to discover how advanced characterization solutions lay the groundwork for breakthroughs in quantum computing, AI acceleration, and next-generation sensing—paving the way for national technological leadership. In recent years, integrated photonics has revolutionized telecom transceivers, propelling data rates and energy efficiency to unprecedented heights. Now integrated photonics is poised to transform quantum photonics, sensing, and artificial intelligence—fields of vital importance to government research and R&D labs. These are exciting times that hold tremendous promise for technology innovators and early adopters. However, testing photonic dies—though critical—remains very challenging when compared to characterizing electronic ICs. This is due to the fact that photonics is still in the early phases of development and design. Nonetheless, fabricating and integrating photonic circuits requires best-in-class characterization through a testing process that is accurate, repeatable, traceable, scalable, flexible and automated. This webinar delves into the intricate world of photonic component characterization, exploring: Pitfalls faced by PIC engineers in government research and lab settings. State-of-the-art methods for evaluating photonic integrated circuits (PIC). Ways to future-proof CAPEX investments through flexible and scalable testing solutions. Don’t miss out—watch now and gain exclusive insights from industry experts! Explore More For deeper insights, check out these related resources: Page : PIC testing Brochure: Optical testing solutions for universities and labs Video : Introducing Opal MD Probe station multi die testing Brochure: Passive component characterization

Resources
MXS-9200 - MEMS optical switch

Jointly developed with DiCon Fiberoptics, this laboratory-grade, high performance optical switch is optimized for use with EXFO LTB solutions and with software control via SCPI over Ethernet.

Products
PSB/SPSB Launch cable / Pulse suppressor boxes

Used in conjunction with an OTDR, the PSB/SPSB covers the OTDR’s dead zone, enabling loss measurement on the first and last connections of a fiber under test.

Resources