CTP10 - Passive optical component testing platform

Overview

Unrivaled passive optical component testing platform for WDM components and photonic integrated circuits

Key features

Optical (IL, PDL, RL) & photocurrent characterization using swept wavelength technique
Industry-first full-band PDL measurement from 1260 to 1620 nm
Unique mix of high dynamic range, accuracy, sub-picometer resolution and test speed
Integrated solution with embedded GUI and built-in analysis
Scalable architecture for R&D and manufacturing environments
Dual operation: Optical triggering using dedicated module / Electrical triggering using logging functionality

Optical (IL, PDL, RL) & photocurrent characterization using swept wavelength technique

Industry-first full-band PDL measurement from 1260 to 1620 nm

Unique mix of high dynamic range, accuracy, sub-picometer resolution and test speed

Integrated solution with embedded GUI and built-in analysis

Scalable architecture for R&D and manufacturing environments

Dual operation: Optical triggering using dedicated module / Electrical triggering using logging functionality

Spectral characterization of integrated photonic components at sub-picometer resolution
Multiple-output passive optical component testing in manufacturing and R&D
WSS and ROADM calibration and tests
Thin film filters (TFF) characterization
Logging function for transient phenomenon
Spectral characterization using electrical trigger from tunable laser

Spectral characterization of integrated photonic components at sub-picometer resolution

Multiple-output passive optical component testing in manufacturing and R&D

WSS and ROADM calibration and tests

Thin film filters (TFF) characterization

Logging function for transient phenomenon

Spectral characterization using electrical trigger from tunable laser