In partnership with CN ROOD
Join our test specialists at PIC Summit in Eindhoven, November 4-5. EXFO and his partner CN ROOD will be showcasing cutting-edge testing solutions for integrated photonics. In the spotlight: the OPAL-SD system, designed to unlock the promise of integrated photonics through unmatched single-die testing capabilities. The OPAL system operates jointly with EXFO's leading test and measurement instruments such as the CTP10 and tunable lasers.
Why tour our booth?
- Witness firsthand the industry's most advanced, automated end-to-end solutions for testing photonic integrated circuits (PIC) and optical components.
- Learn how our flexible and scalable systems can grow with your needs, from lab to fabrication.
Our team will be on hand to discuss how EXFO's comprehensive PIC solutions can address your specific challenges in R&D and manufacturing
