Photonic integrated circuits (PICs) are a well-known technology in the telecom world, mainly thanks to the frantic development of transceivers and passive components that are smaller, faster, cheaper and greener than their bulk-optics counterparts. PICs are also getting traction—both from a commercial and research perspective—in other sectors too (e.g., lab-on-a-chip, LIDAR technology or quantum computing).
Testing active components such as lasers and amplifiers found on PICs is quite straightforward.
An optical spectrum analyzer (OSA) can be used to perform tests on active components simply by connecting the light source or laser output to the OSA to get spectral signal of the sources, as seen below.
Industry-leading OSAs have the advantage of being very fast, performing up to five scans per second at speeds of 2000 nm/sec, fast enough for real-time component alignment and with a high enough resolution to allow measurement of key parameters such as OSNR and SMSR.
For passive component testing, the CTP10 is a device that yields fast, accurate and reliable results, under any test conditions. The CTP10 characterizes the spectral properties of up to 50 optical ports in one single scan with a resolution of 1 pm and more than 75 dB of dynamic range―even when scanning at 100 nm/s. Its electronics and internal processor make data transfer a breeze. The CTP10 can be remotely controlled using SCPI commands, facilitating integration as part of an automated PIC testing setup.
The CTP10 component test platform is a multiport detection system that works in conjunction with the T100S-HP swept tunable laser to measure optical insertion loss and return loss. Such a modular platform can host up to 50 power meters, making it suitable for high port count devices such as AWGs and control several tunable lasers to perform measurements in parallel, increasing throughput and reducing test time.
For passive optical component testing, the CTP10 yields fast, accurate and reliable results, under any test conditions for R&D and manufacturing environments. The CTP10 provides high resolution characterization, even for large contrast spectral features
Improve production yield with R&D-grade solutions that rapidly provide best-in-class measurements. Active components (e.g., lasers inside transceivers, semi-conductor optical amplifiers) can be characterized within seconds by OSA20.
Passive optical components can be tested by CTP10 to picometer resolutions even under stringent conditions.
Flexibility is key in the race to 5G. Designed with the future in mind by collaborating with research groups, these solutions can be integrated into any wafer-testing handling system, with alignment included. CTP10 is an evolutive modular platform, allowing additional or new functions to be added to the system over time. It is compatible with several tunable lasers.
CTP10 fits into a single mainframe, ready to test components at the push of a button.
OSA20 and CTP10 come already packed with analysis features and special test configurations for easy setup.
User-friendly GUIs without any compromise on performance.
A full suite of SCPI automation commands allows the user to fully control the test gear and integrate it in a research test setup or production test bench.