OPAL-SD - Single-die automated probe station

Industry’s most accurate, repeatable, traceable, fast and flexible testing of photonic integrated circuits (PIC).

Testing photonic integrated circuits (PIC) with automated probe stations

Swiftness, control and confidence to accelerate R&D and manufacturing processes

The OPAL-SD is a fully integrated probe station allowing testing of individual photonic integrated chips. It incorporates top-of-the-line equipment to ensure that the most stringent requirements are met while providing the flexibility to evolve with your needs. Equip it with RF probes, optical heads or any other equipment as needed.


The OPAL single-die test station for integrated photonics is composed of a 4-axis manual stage and chuck, as the base system, motorized optical head(s) and manual electrical head(s), including a top-vision system. The station also comes with a side camera, a server-grade PC and a license for the PILOT software suite.

It offers fully automated optical probe navigation at the die-level, and manual electrical probing. When combined with the advanced optical measurements capabilities of EXFO’s product line of optical instrumentation, this system provides an unmatched solution for optical spectrum analysis as well as electro-optic testing such as BER. Together with the PILOT software suite, the OPAL-SD station becomes a complete, flexible and scalable solution.


The PILOT software suite gives tremendous capabilities to the single-die station and transforms it into an automated testing station and a source of quality measurements that can be processed into actionable data. The complete suite of applications supports the full test-and-measurements flow and help users to become more data-driven.

The sequencing environment provides the instrument drivers, analysis tools and built-in optimization algorithms. Its low-code approach enables an expertise-free programming experience. Users can build advanced logical sequences, swap hardware and execute the sequences seamlessly. The system, during execution, tracks all experimental and hardware conditions.

The analysis tool allows the user to launch computations synchronously or asynchronously based on defined logical conditions.

Características principales

Research-grade solution for PIC testing and characterization
Flexible design with reconfigurable probes
Software suite for measurement automation and data processing
Ultra-precise optical heads—ideal for surface and edge-coupling
Precise DC and RF probing manual positioners


Integrated photonics die testing for R&D
Optical and electronic characterization of PIC
Transceiver optical sub-assembly development