BA-4000 Bit Analyzer - Electrical 800G Bit Error Rate Tester

BER tester powered up with forward error correction (FEC) margin.

Características principales

100G (4x28GBd), 400G (4x56GBd) & 800G (8x56GBd)
Supports NRZ and PAM4
Supports PRBS 7/9/11/13/15/23/31/13Q/31Q, SSPRQ
FEC capability: RS-FEC Scrambled Idle Pattern for testing 53 GBd host side interfaces
Channel simulator
Burst/random error injection
Supports linear/gray mapping
O-SMPM connection

Aplicaciones

Test and validation of transceivers
Test of subassemblies such as TOSA and ROSA
Test of FPGA, Module Compliance Board (MCB) and Host Compliance Board (HCB)

Description

Bit error rate (BER) is a key performance attribute for digital communications. The signal transmission quality of a network, subsystem or component, can be evaluated using a BER tester, which compares the data stream received to the transmitted sequence and computes the number of errors.

The BA-4000 Bit Analyzer is an electrical NRZ/PAM4 BER tester designed for the production floor. It comes in six models:

  • BA-4000-4-28-NRZ: 100G BERT including 4-channel NRZ 28 Gbit/s.
  • BA-4000-8-28-NRZ: 200G BERT including 8-channel NRZ 28 Gbit/s.
  • BA-4000-4-28-PAM: 100G/200G BERT enabling either 4-channel NRZ 28 Gbit/s or 4-channel PAM4 28 GBd.
  • BA-4000-4-56-PAM: 200G/400G BERT enabling either 4-channel NRZ 56 Gbit/s or 4-channel PAM4 56 GBd.
  • BA-4000-8-28-PAM: 200G/400G BERT suitable for either 8-channel NRZ 28 Gbit/s or 8-channel PAM4 28 GBd.
  • BA-4000-8-56-PAM: 400G/800G BERT suitable for either 8-channel NRZ 56 Gbit/s or 8-channel PAM4 56 GBd.

The BA-4000 Bit Analyzer leverages FEC simulation capabilities to provide powerful analysis for burst error. Some of the main FEC features are:

  • PRBS error check and correction
  • Pre-FEC and Post-FEC BER
  • KP4/KR4 and low latency FEC protocols
  • FEC Generator and Checker (FGC) to address RS-FEC Scrambled Idle Pattern
  • FEC symbol error distribution plot: codewords vs symbols errors
  • FEC margin auto-calculation
Notas de aplicación
399 - BA-4000-L2-RCNC LPO transceivers - English (marzo 12, 2025)
Notas de aplicación
399 - BA-4000-L2-RCNC LPO transceivers - Français (marzo 12, 2025)
Notas de aplicación
399 - BA-4000-L2-RCNC LPO transceivers - 日本語 (marzo 12, 2025)
Notas de aplicación
399 - BA-4000-L2-RCNC LPO transceivers - 中文 (marzo 12, 2025)
Volantes y panfletos
Lab-to-fab, Fab-to-live - RCNC - English (abril 08, 2025)
Volantes y panfletos
Lab-to-fab, Fab-to-live - RCNC - 日本語 (abril 08, 2025)
Volantes y panfletos
Lab-to-fab, Fab-to-live - RCNC - Français (abril 08, 2025)
Manual del usuario
BA-4000 Bit Analyzer - English (noviembre 01, 2021)
Seminarios web
Optimizing power usage as data centers shift to 800G - Español (enero 17, 2024)
Hoja de especificaciones
BA-4000 Bit Analyzer - English (marzo 26, 2025)
Hoja de especificaciones
BA-4000 Bit Analyzer - Français (marzo 26, 2025)
Hoja de especificaciones
BA-4000 Bit Analyzer - 中文 (marzo 26, 2025)
Hoja de especificaciones
BA-4000 Bit Analyzer - 日本語 (marzo 26, 2025)
Blog
How to address challenges in the end-to-end qualification of pluggable transceivers? - Español (enero 17, 2021)
Seminarios web
From 400G to 800G: encoded FEC - Español (mayo 17, 2023)
Seminarios web
Still bogged down by issues when rolling out next-gen high speeds from R&D to manufacturing? - Español (mayo 16, 2023)
Notas de aplicación
Unveiling the secrets of 200G/400G optical transceivers - English (marzo 20, 2020)
Apéndices
Notice Important Information BA-4000 - English (noviembre 23, 2022)
Apéndices
Notice Important Information BA-4000 - Français (noviembre 23, 2022)

Asistencia