BA-4000 Bit Analyzer -

Electrical BER tester supporting NRZ and PAM4 coding, with advanced FEC tools and with testing capabilities up to 800G.

Características principales

100G (4x28GBd), 400G (4x56GBd) & 800G (8x56GBd)
Supports NRZ and PAM4
Supports PRBS 7/9/11/13/15/23/31/13Q/31Q, SSPRQ
FEC capability: RS-FEC Scrambled Idle Pattern for testing 53 GBd host side interfaces
Channel simulator
Burst/random error injection
Supports linear/gray mapping
O-SMPM connection
Reflection cancellation and noise cancellation (RCNC) for LPO testing

Aplicaciones

Test and validation of transceivers and cables
Test of optical components and PIC
Test of high-speed electrical IC

Descripción

Bit error rate (BER) is a key performance attribute for digital communications. The signal transmission quality of a network, subsystem or component, can be evaluated using a BER tester, which compares the data stream received to the transmitted sequence and computes the number of errors.


The BA-4000 Bit Analyzer is an electrical NRZ/PAM4 BER tester designed for the production floor. It comes in six models:

  • BA-4000-4-28-NRZ: 100G BERT including 4-channel NRZ 28 Gbit/s.
  • BA-4000-8-28-NRZ: 200G BERT including 8-channel NRZ 28 Gbit/s.
  • BA-4000-4-28-PAM: 100G/200G BERT enabling either 4-channel NRZ 28 Gbit/s or 4-channel PAM4 28 GBd.
  • BA-4000-4-56-PAM: 200G/400G BERT enabling either 4-channel NRZ 56 Gbit/s or 4-channel PAM4 56 GBd.
  • BA-4000-8-28-PAM: 200G/400G BERT suitable for either 8-channel NRZ 28 Gbit/s or 8-channel PAM4 28 GBd.
  • BA-4000-8-56-PAM: 400G/800G BERT suitable for either 8-channel NRZ 56 Gbit/s or 8-channel PAM4 56 GBd.


The BA-4000 Bit Analyzer leverages FEC simulation capabilities to provide powerful analysis for burst error. Some of the main FEC features are:

  • PRBS error check and correction
  • Pre-FEC and Post-FEC BER
  • KP4/KR4 and low latency FEC protocols
  • FEC Generator and Checker (FGC) to address RS-FEC Scrambled Idle Pattern
  • FEC symbol error distribution plot: codewords vs symbols errors
  • FEC margin auto-calculation
Notas de aplicación
399 - BA-4000-L2-RCNC LPO transceivers - English (marzo 12, 2025)
Notas de aplicación
399 - BA-4000-L2-RCNC LPO transceivers - Français (marzo 12, 2025)
Notas de aplicación
399 - BA-4000-L2-RCNC LPO transceivers - 日本語 (marzo 12, 2025)
Notas de aplicación
399 - BA-4000-L2-RCNC LPO transceivers - 中文 (marzo 12, 2025)
Volantes y panfletos
Lab-to-fab, Fab-to-live - RCNC - English (abril 08, 2025)
Volantes y panfletos
Lab-to-fab, Fab-to-live - RCNC - 日本語 (abril 08, 2025)
Volantes y panfletos
Lab-to-fab, Fab-to-live - RCNC - Français (abril 08, 2025)
Seminarios web
Optimizing power usage as data centers shift to 800G - Español (enero 17, 2024)
Blog
How to address challenges in the end-to-end qualification of pluggable transceivers? - Español (enero 17, 2021)
Seminarios web
From 400G to 800G: encoded FEC - Español (mayo 17, 2023)
Seminarios web
Still bogged down by issues when rolling out next-gen high speeds from R&D to manufacturing? - Español (mayo 16, 2023)
Notas de aplicación
Unveiling the secrets of 200G/400G optical transceivers - English (marzo 20, 2020)
Apéndices
Notice Important Information BA-4000 - English (noviembre 23, 2022)
Apéndices
Notice Important Information BA-4000 - Français (noviembre 23, 2022)
Volantes y panfletos
Leading-edge transmission testing up to 800G - English (octubre 26, 2021)
Volantes y panfletos
Leading-edge transmission testing up to 800G - 中文 (octubre 26, 2021)
Volantes y panfletos
Leading-edge transmission testing up to 800G - 日本語 (octubre 26, 2021)
Notas de aplicación
Testing next-gen PIC-based transceivers - English (julio 07, 2021)

Asistencia