This video, by leading test expert François Couny, walks you through EXFO’s comprehensive portfolio of test solutions for active and passive optical components on integrated photonics. Learn how to garner compounded benefits of an integrated solution leveraging the industry’s best-in-class specifications.
Unrivaled passive optical component testing platform for WDM components and photonic integrated circuits
Compact tester for fast and accurate characterization of passive optical components
Bring power to your lab with a powerful, scalable and hot-swappable twelve-slot rackmount or benchtop platform designed for advanced lab and manufacturing photonic applications.
Jointly developed with DiCon, this all-optical cross-connect technology is optimized for EXFO systems and software, providing fast protection switching at the fiber layer, automation of test sequences and instrument-grade performance.
Fastest diffraction-grating-based instrument operating from 1250 to 1700 nm. Provides fast, accurate, high dynamic range scan. Unique touch-sensitive display with multitouch gesture control.
Multifunction modular platform for fiber-optic component testing with up to eight pluggable modules
Faster and highly reliable testing for optical components, including photonic integrated circuits.
Faster and highly reliable testing for optical components, including photonic integrated circuits.
Electronically controlled. Center wavelength and bandwidth can both be set precisely and independently. Covers all key wavelengths from 1260 nm to 1650 nm and bandwidths from 32 pm (4 GHz) to 5 nm.
With the XTM-50 both center wavelength and bandwidth can be independently adjusted. It is manually controlled and versions are available covering all the key telecom wavelengths from 1260 nm to1650 nm and bandwidths from 32 pm (4 GHz) to 5 nm.
