Ce produit n'est pas disponible pour la vente au Québec.

A B C D E F G H I J K L M N O P Q R S T U V W X Y Z 0-9
  • 中文

CT440/CT440-PDL - 无源元器件测试仪


规格书 (PDF) 用户手册 (PDF)

所有产品 CT440/CT440-PDL - 无源元器件测试仪
所有产品 CT440/CT440-PDL - 无源元器件测试仪


  • 快速测量变化函数
  • 波长范围为1240-1680 nm(SMF型号)
  • PM和PDL选件
  • 波长分辨率为1-250 pm
  • 波长精度为±5 pm
  • 单次扫描的动态范围为65 dB


  • Photonic integrated circuit (PIC) testing
  • Wavelength selective switch testing
  • Optical filter testing


EXFO’s compact CT440 lets you quickly and accurately test passive optical components (e.g., MUX/DEMUX, filters, splitters) and modules (ROADM, WSS). What’s more, the unit covers the spectral range from 1240 to 1680 nm, allowing for measurements over the full telecom band. With the PDL option, the CT440 can simultaneously measure insertion loss and polarization dependent loss.

Full-band sweep

The CT440 (SMF model) can operate between 1240 and 1680 nm. When several TLSs are used, the CT440 can automatically switch between the lasers to allow for seamless full‑band measurements. The single connection to the DUT means no external switch is required.

Fast insertion loss measurement

The CT440 features a unique combination of high-speed electronics and optical interferometry. The four integrated detectors let you simultaneously measure four channels with a 65 dB dynamic range in a single laser sweep. Moreover, ±5 pm wavelength accuracy is achieved at any sweep velocity, so there is no compromise between measurement speed and accuracy.

Accurate insertion loss measurement

The CT440 is a cost-effective solution that doesn’t compromise on performance. With its monitoring photodetector, adjustable sampling resolution, superior wavelength accuracy and built-in wavemeter, it delivers everything you need for accurate measurements in a single box when interfaced with a tunable laser source and PC.

CT440/CT440-PDL - 无源元器件测试仪


  • 询价




Thank you.