Application notes
Power Meter Calibration at EXFO - English
(August 22, 2011)
Application notes
Power Meter Calibration at EXFO - 中文
(August 22, 2011)
Application notes
Fast and Easy Programming with the IQS-500 Intelligent Test System: PDL as a Function of Wavelength - English
(August 22, 2011)
Application notes
Fast and Easy Programming with the IQS-500 Intelligent Test System: PDL as a Function of Wavelength - 中文
(August 22, 2011)
Discontinued spec sheets
ARU-100 HPNA Test Probe - English
(August 22, 2011)
Discontinued spec sheets
ARU-100 HPNA Test Probe - 中文
(August 22, 2011)
Discontinued spec sheets
ARU-100 HPNA Test Probe - Español
(August 22, 2011)
Discontinued spec sheets
ARU-100 HPNA Test Probe - Deutsch
(August 22, 2011)
Application notes
A New Test Method for the Quantitative Determination of BAD PMD Sections Along an Installed Fiber Link - English
(August 21, 2011)
Application notes
RFTS Integration into an Existing Geographical Information System - English
(August 21, 2011)
Application notes
2600B Series Tunable Laser Sources: Wavelength Uncertainty and User Calibration Procedures - English
(August 21, 2011)
Application notes
Ensuring the Availability and Reliability of Dark-Fiber Networks - English
(August 21, 2011)
Application notes
DFL-5720 Digital Frequency-Locking System: Simplifying Wavelength-Locker Testing - English
(August 21, 2011)
Application notes
Automated Pivot Point Location for Optical Component Manufacturing - English
(August 21, 2011)
Application notes
Optimization of UV Curing Process for Adhesive Bonding in Medical Device Assembly - English
(August 21, 2011)