Application notes
Tunable DFB Laser Sources: The Right Choice for EDFA and System Level Testing - English
(August 22, 2011)
Application notes
Tunable DFB Laser Sources: The Right Choice for EDFA and System Level Testing - 中文
(August 22, 2011)
Application notes
Power Meter Calibration at EXFO - English
(August 22, 2011)
Application notes
Power Meter Calibration at EXFO - 中文
(August 22, 2011)
Application notes
Fast and Easy Programming with the IQS-500 Intelligent Test System: PDL as a Function of Wavelength - English
(August 22, 2011)
Application notes
Fast and Easy Programming with the IQS-500 Intelligent Test System: PDL as a Function of Wavelength - 中文
(August 22, 2011)
Discontinued spec sheets
ARU-100 HPNA Test Probe - English
(August 22, 2011)
Discontinued spec sheets
ARU-100 HPNA Test Probe - 中文
(August 22, 2011)
Discontinued spec sheets
ARU-100 HPNA Test Probe - Español
(August 22, 2011)
Discontinued spec sheets
ARU-100 HPNA Test Probe - Deutsch
(August 22, 2011)
Application notes
Stability Effects on Optical Component Assembly and Measurement Using an Automation System - English
(August 21, 2011)
Application notes
Reconfigurable Optical Add/Drop Multiplexers—Testing Issues - English
(August 21, 2011)
Application notes
Characterizing Polarization-Dependent Wavelength in AWGs and PLCs - English
(August 21, 2011)
Application notes
Wavelength Meter Theory: Michelson Interferometry - English
(August 21, 2011)
Application notes
New OSA 40 Gbit/s Software Function - English
(August 21, 2011)
Application notes
Refracted Near-Field Measurements of Refractive Index and Geometry of Silica-on-Silicon Integrated Optical Waveguides - English
(August 21, 2011)