CT440/CT440-PDL - evaluador de componentes ópticos

Evaluador compacto para la caracterización rápida y precisa de componentes ópticos pasivos

Características principales

Medición rápida de función de transferencia
Rango de longitud de onda de entre 1240 nm y 1680 nm (modelo SMF)
Opciones PM y PDL
Resolución de longitud de onda de entre 1 pm y 250 pm
Precisión de longitud de onda de ±5 pm
Rango dinámico de 65 dB en una sola barrida
Combina hasta cuatro láseres ajustables (modelo SMF)
Cuatro detectores internos, expansibles con sincronización

Aplicaciones

Pruebas de circuitos integrados fotónicos (PIC)
Pruebas de conmutadores selectivos de longitud de onda
Pruebas de filtros ópticos

Especificaciones

Especificaciones
Product type Benchtop
Hoja de especificaciones

Descripción

EXFO’s compact CT440 lets you quickly and accurately test passive optical components (e.g., MUX/DEMUX, filters, splitters) and modules (ROADM, WSS). What’s more, the unit covers the spectral range from 1240 to 1680 nm, allowing for measurements over the full telecom band. With the PDL option, the CT440 can simultaneously measure insertion loss and polarization dependent loss.


Full-band sweep

The CT440 (SMF model) can operate between 1240 and 1680 nm. When several TLSs are used, the CT440 can automatically switch between the lasers to allow for seamless full‑band measurements. The single connection to the DUT means no external switch is required.


Fast insertion loss measurement

The CT440 features a unique combination of high-speed electronics and optical interferometry. The four integrated detectors let you simultaneously measure four channels with a 65 dB dynamic range in a single laser sweep. Moreover, ±5 pm wavelength accuracy is achieved at any sweep velocity, so there is no compromise between measurement speed and accuracy.


Accurate insertion loss measurement

The CT440 is a cost-effective solution that doesn’t compromise on performance. With its monitoring photodetector, adjustable sampling resolution, superior wavelength accuracy and built-in wavemeter, it delivers everything you need for accurate measurements in a single box when interfaced with a tunable laser source and PC.
Volantes y panfletos
Testing photonics and optical components for manufacturing, design and research challenges - English (junio 20, 2023)
Volantes y panfletos
Testing photonics and optical components for manufacturing, design and research challenges - 中文 (junio 20, 2023)
Volantes y panfletos
Testing photonics and optical components for manufacturing, design and research challenges - 日本語 (junio 20, 2023)
Volantes y panfletos
PIC-Optical integrated circuits test solution - 日本語 (octubre 26, 2021)
Demostraciones de productos
An overview of EXFO Optics product portfolio - Español (mayo 18, 2023)
Demostraciones de productos
Is your optical component testing future-proof? - Español (mayo 18, 2023)
Videos promocionales
Comprehensive testing of integrated photonics from lab to fab - Español (septiembre 11, 2023)
Videos promocionales
Futureproof component testing platforms and tunable lasers - Español (septiembre 11, 2023)
Videos promocionales
Automated wafer-level testing of photonic integrated circuits - Español (mayo 18, 2023)
Folletos y catálogos
Optical testing solutions for universities and labs - English (diciembre 23, 2024)
Hoja de especificaciones
CT440/440-PDL optical component tester - English (junio 14, 2025)
Hoja de especificaciones
CT440/440-PDL optical component tester - Français (junio 14, 2025)
Hoja de especificaciones
CT440/440-PDL optical component tester - 中文 (junio 14, 2025)
Hoja de especificaciones
T200S - English (junio 30, 2025)
Hoja de especificaciones
T200S - Français (junio 30, 2025)
Hoja de especificaciones
T200S - 中文 (junio 30, 2025)

Asistencia