CTP10 - 无源光器件测试平台

性能强大的无源光器件测试平台,适用于测试WDM器件和光子集成电路

主要优点

使用扫频技术进行光损耗(IL、PDL和RL)与光电流测量  
业内率先支持全波段PDL测量,覆盖从1260 nm到1620 nm的波长 
集高动态范围、高精准度、亚皮米级分辨率和高测试速度于一身 
成的解决方案,配备GUI,并内置分析功能  
采用可扩展的架构,适用于研发和制造环境 
两种工作模式:使用专用模块进行的光学触发/使用日志记录功能进行的电气触发 

应用

亚皮米级分辨率的集成光子器件光谱鉴定
制造和研发环境中的多输出无源光器件测试
WSS和ROADM校准与测试
薄膜滤波器(TFF)鉴定
瞬态现象日志记录功能
使用来自可调谐激光器的电气触发器进行光谱鉴定

描述

The CTP10 is a modular passive optical component testing platform that combines speed, accuracy and flexibility. It offers reliable high-quality insertion loss (IL), return loss (RL) or polarization-dependent loss (PDL) measurement regardless of wavelength range or spectral characteristics of the device under test. It operates together with EXFO’s series of swept tunable lasers to perform these measurements within seconds and can be configured to acquire photocurrent measurements directly from external photodiodes.

Thanks to its modular configuration, it is the ideal instrument to characterize large port count components used in WDM networks and photonic integrated circuits (PIC).


Next-gen platform and modules

Thanks to its innovative approach, the CTP10 also greatly reduces setup time and simplifies spectral characterization by taking care of many complex operations. Indeed, tunable laser sweep, data collection and processing for IL, RL or PDL, trace display and analysis are all performed from a single instrument.

The CTP10 platform is compatible with a selection of key modules for spectral characterization (IL PDL & IL PDL OPM2 modules or IL RL OPM2), wavelength control (SCAN SYNC and FBC modules), optical detection (OPMx module) and photocurrent meters (PCMx module). These fully integrated modules are hot-swappable and quickly reconfigurable to greatly reduce setup time and provide a flexible and evolutive test solution.

The CTP10 can also be set up to receive external triggers coming from a tunable laser and record optical power or photocurrent as​ a function of wavelength. In this configuration, the CTP10 only requires OPMLite or PCM modules. The resolution, accuracy and repeatability of the measurement lies with the laser, but the setup benefits from the detectors single gain range and fast averaging time. Additional capabilities include optical power time-logging suited for capturing optical transient phenomenon and analog signal output suited for automated optical alignment processes.

The CTP10 has an embedded operating system for handling and processing large amounts of data. It also offers a scalable architecture by sharing one or several tunable lasers among up to 8 test stations and by adding a secondary mainframe for 100+ ports testing.

Unparalleled performance

The CTP10 offers uncompromising performance and maintains best-in-class specifications at full speed over the full wavelength range of operation with an integrated setup. This combination of speed, accuracy, integration and spectral coverage is unprecedented on the market and ideal as a future-proof testing solution on next generation components such as wavelength selective switches (WSS) or ring-resonators.

The SCAN SYNC module provides a dynamic wavelength measurement with a sampling resolution down to 20 fm and excellent repeatability.

The range-free series of OPMx optical detectors can measure a dynamic range of >70 dB in a single sweep at 100 nm/s with 1 pm resolution. This ability substantially increases manufacturing and R&D throughput. OPMx detectors can also accurately measure extremely sharp spectral features of up to 10 dB/pm (10,000 dB/nm). PCMx photocurrent meters perform equally well when performing tasks such as measuring large current fluctuations coming from PIC-embedded photodiodes. The OPMLite are also particularly suited for detection scheme where tunable laser is connected directly to the power meter for spectral characterization.

Powerful intuitive GUI

The CTP10 has been developed around three key principles: integration, performance and automation. Its embedded software offers a powerful and intuitive GUI that seamlessly controls the measurement process to let you focus on what really matters: measurement data and analysis. Additionally, the CTP10 offers full remote control via SCPI‑compatible commands.

奖项和荣誉 

创新和领导力一直是EXFO关注的核心和首要问题。每年,我们都努力开发出可在更智能的现代网络中确保优异客户体验的解决方案。得到这样的认可始终是一项殊荣。了解公司所获奖项的详情: 

Judge

通过强大的数据处理功能,可对 1240 nm 至 1680 nm 波长范围内的插入损耗和 PDL 进行高精度自动测量,大大缩短了测试时间。

无源光器件测试平台内的先进模块
应用说明
Programming the CTP10 component test platform - English (2022年4月11日)
应用说明
Swept IL measurement: Key notions and future-proof solutions - English (2019年4月23日)
应用说明
Insertion loss referencing procedure on the CTP10 test platform - English (2023年3月27日)
应用说明
Return loss referencing using the CTP-10 test platform - English (2023年3月27日)
参考海报
测试PIC和无源器件 - English (2024年12月17日)
参考海报
测试PIC和无源器件 - 中文 (2024年12月17日)
白皮书
117 - Optical component testing in a rapidly evolving 5G world - English (2019年5月15日)
手册和产品目录
Optical testing solutions for manufacturing and R&D - English (2024年12月23日)
手册和产品目录
Optical testing solutions for manufacturing and R&D - Français (2024年12月23日)
手册和产品目录
Optical testing solutions for manufacturing and R&D - 中文 (2024年12月23日)
传单和宣传册
器件与PIC测试 - English (2023年6月20日)
传单和宣传册
器件与PIC测试 - 中文 (2023年6月20日)
传单和宣传册
器件与PIC测试 - 日本語 (2023年6月20日)
传单和宣传册
PIC-Optical integrated circuits test solution - 日本語 (2021年10月26日)
应用说明
Characterization of spectrally fine responses of optical passive devices - English (2023年10月25日)
应用说明
Characterization of spectrally fine responses of optical passive devices - 日本語 (2023年10月25日)
应用说明
Characterization of spectrally fine responses of optical passive devices - 中文 (2023年10月25日)

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