BA-1600——1.6T误码率分析仪

一流的1.6T电误码率分析仪，提供8通道PAM4编码选件，实现非常灵活的测试配置

规格书

主要优点

在实验室、工厂和现场环境中进行1.6T、800G和400G全生命周期验证

卓越的硬件设计：原生电气接口、卓越的信号质量、干净的眼图及低错误平层

高性能的信号完整性与误码率测试，用于验证下一代1.6T设计的合规性与性能

灵活、经济高效：可选择8通道配置进行光模块测试，或4通道配置进行高速器件测试

易用的图形用户界面（GUI）可简化工作流程，并缩短学习曲线

支持PAM4以验证高速信号传输性能

支持FEC生成和分析测试，确保超高速连接中的数据完整性

支持实时的FEC分析：测试pre/post FEC BER、符号错误分布和FEC裕量

提供强大的均衡器和通道模拟器：强大的均衡器包括连续时间线性均衡器（CTLE）

提供I²C寄存器读写功能，可直接控制和监测设备参数，实现快速的初级诊断与高效调试

为所有适用参数提供“保存和加载”功能，可节省宝贵时间并确保测试一致性

通过自动化，简化复杂的测试配置，并加快验证过程

应用

800G/1.6T互连测试

1.6T收发器的测试与验证

制造过程中的高吞吐量测试

超大规模数据中心与人工智能数据中心

Win the race to 1.6T 

with test solutions that go from lab to fab today.

The BA-1600 1.6T Bit Analyzer series delivers full lifecycle validation for 1.6T, 800G and 400G testing across lab, fab and live environments. Supporting 4- channel and 8-channel PAM4 coding at 106.25, 53.125 and 26.5625 GBd per lane, it’s purpose-built as an electrical BERT for validating 1.6T Ethernet in R&D, production and test labs.

Designed for speed and simplicity, the BA-1600 series features a user-friendly GUI, powerful automation and ‘save-and-load’ functionality to streamline workflows and reduce setup time. Engineers can run high-performance signal integrity and BER testing, generate and analyze FEC, monitor block error ratio (BLER), and access I²C registers for fast, low-level diagnostics and debugging. API-controlled and ready to test 1.6T now, the BA-1600 series ensures efficient and consistent validation of next-gen designs.

Transceiver designers, hyperscalers and AI data centers

Transceiver designers choose the BA-1600 series test solution for complete lab-to-live testing of their 1.6T transceiver technology. This encompasses the development of transceivers in a lab environment, to the fabrication process of the device, through to ensuring those devices work as expected out in live environments. Hyperscalers use the BA-1600 series to perform pre-evaluation testing of transceivers prior to mass deployment of equipment across their AI data centers, ensuring the latest transceiver technology is working as per specification and is interoperable.

FEC is built in—so testing needs to go deeper

In next-gen optical transceivers, FEC encoding and decoding has moved from the host to inside the transceiver itself—making FEC testing essential for supported models. These transceivers now do more than convert electrical to optical signals; they actively manage error correction.

In 200G-per-lane transceivers using concatenated FEC, as defined by IEEE 802.3dj, it’s critical to test resilience to error bursts.

EXFO’s BA-1600 includes a powerful hardware FEC generation and analysis capability, enabling validation under real-world conditions, including error bursts. 