AXS version 1.9

• Test parameters are automatically loaded from the test configuration files.
• Configured parameters are protected from unintended changes.
• The range, pulse width, acquisition mode, auto mode, wavelengths, IOR, detection thresholds, and pass/fail criteria now comply with the test configuration rules.
• Editing capabilities are dynamically controlled based on whether or not the values are defined in the configuration file.
• The acquisition mode displayed on the screen now accurately reflects the mode defined by the active configuration.

• Support for wavelengths defined in OPM test configuration files.
• Support for OPM minimum and maximum threshold values.
• The name of the active test configuration is displayed in the Power Checker interface.
• The test configuration can be selected directly from a task.
• OPM parameters and thresholds can be locked when controlled by the test configuration.
• The name of the test configuration now appears in the summary generated and sent to the EXFO ecosystem.

• Pass/Fail thresholds now support wavelength-specific values.
• Thresholds are displayed by wavelength (1,310 nm / 1,550 nm / 1,650 nm).
• Missing wavelength values are automatically replaced with the configured default values.
• Modification rules apply independently to both configured and unconfigured values.

AXS 1.9 expands PON analysis capabilities, increasing the number of splitter stages from two to three.

Supported features

• Automatic splitter detection via iOLM
• Manual OTDR analysis
• Test configuration files
• Graphical topology display
• Report generation in PDF format

Supported actions

• Replace a splice with a connector.
• Restore a splice in place of a modified connector.

Additional behavior

• Threshold calculations are automatically recalculated after any changes.
• Modified events are marked with an asterisk (*) in the results.
• Reports include clear annotations for manually modified events.

The OTDR reports generated now display thresholds specific to each wavelength

The improvements include the following:

• Display of threshold values for 1,310 nm, 1,550 nm, and 1,650 nm.
• Precise mapping between thresholds and wavelengths.
• Improved readability of the reports.

• The text on the welcome screen has been updated to better new users.
• Improved visibility of information regarding the active test configuration.