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The bandwidth boom puts a lot of pressure on the transceiver industry. This webcast reviews the current challenges that pluggable vendors are facing when validating transceivers at various stages of manufacturing and the best practices in addressing the testing and qualification of next-gen transceivers.
The demand for bandwidth from data centers and wireless applications—including 5G—means that several new generations of transceivers are being developed and mass produced at an incredibly fast pace. Manufacturers need to test and churn out thousands of transceivers per day, so the testing solutions must be both extremely fast and reliable, to save time during the manufacturing process while guaranteeing quality.
- What are the current challenges in 400G-800G testing?
- What are the various tests to perform for an electrical/optical validation of next-gen transceivers of next-gen transceivers?
- What are the tools to optimize qualification?
Aldo Gutierrez, Product specialist, EXFO
Aldo Gutierrez is Product Specialist in Manufacturing Design and Research at EXFO. He has more than five years of experience in research and development in the field of optical communications. He has brought his expertise to around 20 international scientific conferences and has also collaborated in more than 15 peer-reviewed articles as author and coauthor. He holds a bachelor's and master's degree in electrical engineering from the National Autonomous University of Mexico and a PhD in physics from the University of Rennes 1. At EXFO, Aldo supports and launches tactical activities related to optical spectrum analyzers, tunable filters, BER testers, optical scopes and 400G transport & datacom solutions.
Stephen Hardy, Editorial Director and Associate Publisher, Lightwave