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Navigating the murky waters of swept PDL measurement

White paper

The 4-state Mueller method has become an industry standard for swept PDL measurement thanks to its high accuracy, picometer resolution, and fast measurement times.

The Mueller method however suffers from common misconceptions and is not always well-understood despite being widely used for swept IL-PDL testing in R&D and manufacturing.

This white paper dives into the formalism of the Mueller method, it’s a must-read for every test engineer.

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Key takeaways

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About the author

  • Mathieu Bergont

    Product Specialist

    Mathieu Bergont is a product specialist at EXFO, with a focus on solutions for testing passive optical components in lab and manufacturing environments. Mathieu has over eight years of experience in the field of fiber optic testing and holds a Master of Engineering in Material Science, Semiconductors and Micro-Nanotechnologies from INSA Lyon in France.

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