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This article reviews the basics of light-emitting diodes (LEDs)—whether they are edge-emitting (EELED), surfaceemitting, or super-luminescent diodes (SLEDs)—in test and measurement applications.
ResourcesThis article defines the terms VLAN and Q in Q; it describes their benefits and provides concrete examples of how Q in Q and VLANs are used.
ResourcesThis article explains how we can extend the application of a piezo-electric solution switcher through the integration of the hardware and software elements to satisfy experimental needs, going beyond ...
ResourcesThis article explains the importance of understanding the specific sources of mechanical drift and subsequent corrective action that needs to be taken to minimize pipette drift for patch clamp recordi...
ResourcesThis article explains the importance to understand how nanoposition and alignment come together, to become successful in process development.
ResourcesThis article presents one method to create .NET scripts in order to maximize your efficiency when testing with the EXFO’s transport and datacom test modules.
ResourcesThis technical note provides some experimental results and a few design rules to adequately address the Raman scattering problem.
ResourcesThis application note introduces an exact analysis, based on the fundamentals of the standard method, but using a slightly modified setup, largely extending the application domain of the interferometr...
ResourcesThis application note presents how to ensure that Ethernet links are ready for the high-quality services customers are demanding and how to turn SLAs into sales tools that help service providers attra...
ResourcesThis article discusses EXFO's implementation of the Bellcore OTDR format, which offers the advantage of being able to build a database with test results from different OTDR manufacturers.
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