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Spectral characterization of photonic integrated circuits

Hosted by

François Couny

Senior Product Line Manager

François Couny is Product Line Manager for EXFO Optics. He started his career in 2001 as a Test & Measurement engineer at Blaze Photonics, a start-up company specialized in Photonic Crystal Fibre and completed his Ph.D. in Photonics in 2008 at the Centre for Photonics and Photonic Material at the University of Bath (UK). He went on to join Yenista Optics in 2010 with a focus on developing tuneable laser sources and spectral solutions, including an Optical Spectrum Analyzer and also an optical component tester adapted to photonic integrated circuits characterization. Since 2015, François has been PLM for Yenista Optics, now part of EXFO as EXFO Optics.

This webinar is the first of a series around optical challenges faced by organizations in India, involved in manufacturing, design and research when developing and producing next-generation technologies. Each episode explores specific sets of challenges and the appropriate testing solutions needed to prevent or solve issues.

There’s a new breed of components creating a revolution across the entire photonics spectrum of industries: integrated photonic technology. Initially used in telecom applications, integrated photonics is now reaching consumers through sensing, medical or quantum computing applications.

Although the use of photonic integrated circuits (PIC) varies wildly from one application to the next, testing these cutting-edge components often require similar tool sets. However, to meet today’s booming demand and stringent standards these tools must deliver reliability and accuracy each and every time.
This webinar episode presents real-world cases of how flexible testing solutions can help achieve efficiencies in PIC development and manufacturing.

Key takeaways

  • Understanding the challenges when testing PICs
  • Making spectral testing flexible and configurable
  • Technical demo for polarization sensitive devices

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