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FTTx/PON Component Manufacturing

Designing and manufacturing components integrated in FTTx systems and networks brings specific test and measurement requirements.

First, components must be tested over the entire wavelength range used in FTTx networks (covering the O, E, S, C, L and U bands).

Second, since cost-efficiency is a key issue with FTTx components, test cycles must be fast. Choosing test systems that meet both these requirements is therefore a clear bottom-line benefit

Featured FTTx Component Testing Solutions

Test Method Description Proposed Equipment
All-Band Component Analysis Uses a fast tunable laser source to test passive components for IL, ORL and PDL on up to 32 channels simultaneously. Performs continuous characterization over the 1260-1630 nm range for production testing, troubleshooting or validation of vendor-provided specs.
Cable Assembly Testing Delivers IL and high-reflectance measurements for patchcord, multifiber and other interconnect assemblies. Tests singlemode fiber at 1310/1490/1550/ 1625 nm, and multimode fiber at 850/1300 nm. Well suited for hard-to-test fanout and hybrid assemblies.