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Wave Review
 Up-to-date information about critical issues and the latest advances in optical test and measurement, network monitoring and manufacturing.
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| March 2003, Volume 9 Number 3 |
| PMD Measurement: the EXFO Interferometric Method The interferometric method has always been "the" method to test PMD and, over time, its limitations have been forgotten. But what if the standard method just got a lot better? [Click here for full story] |
| Creating Made-to-Measure Applications Today's challenging NSP market demands that expenses be maintained according to revenue per bit. This calls for integrated solutions adapted to that reality. [Click here for full story] |
| Sensitivity and Repeatability for Measuring Reflectance Drift in Fiber-Optic Connectors The challenge: measuring reflectance in low-reflection connectors. The solution: reliable test instruments and a solid knowledge of relevant technology aspects. [Click here for full story] |
| Understanding Launch Conditions for Multimode Connector and Cable Assembly Testing There are problems related to the insertion loss measurement of multimode connectorrs and cable assemblies. Fortunately, there are solutions too. [Click here for full story] |
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Convert NetTest OTDR Traces to EXFO Format. EXFO's OTDR trace conversion service lets you access your NetTest traces using EXFO equipment. Check it out today.
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Testing components or simulating traffic requires multiple test heads and can be expensive. For lower BER-testing costs, use a customizable, high port density solution .
Read on.
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