Home > Library >

Wave Review

Wave Review - EXFO's Technical Newsletter
Up-to-date information about critical issues and the latest advances in optical test and measurement, network monitoring and manufacturing.
October-November  2006, Volume 12, Number 9
In this issue

Benefits of VLANs and Q in Q

The terms VLAN and Q in Q are common in Ethernet technology. This article defines and demystifies these terms while explaining their advantages and providing concrete examples of how they are used.
[Click here for full story]

IPTV – Living on the Edge

Carriers have developed methods to efficiently turn up IPTV services for new subscribers but, until now, portable testing solutions that would measure the quality and stability of the video have had difficulty isolating the source of any given fault. This article discusses how excess outages can be avoided, how to eliminate signal errors and how to determine the origin of faults.
[Click here for full story]

Component Manufacturing and Return Loss Testing: OCWR vs. Mandrel-Free Technique

For high-fiber-count components, RL testing can be a major source of inefficiency as some techniques necessitate a lot of handling. This article reviews and compares two RL measurement methods: the traditional optical continuous-wave reflectometry (OCWR) technique and a new mandrel-free technique.
[Click here for full story]
40 Gbit/s Testing Corner


Many network operators are seriously considering the implementation of 40 Gbit/s networks.

As experts in the field of network testing, we at EXFO have added a special section to our newsletter that will be dedicated specifically to 40 Gbit/s testing issues. Join us monthly for a concise look at different aspects of the technology and what they entail. This month:

The Dawn of a New Era

All testing issues that affect today’s 10 Gbit/s network will apply to tomorrow’s 40 Gbit/s networks. In addition, several new parameters may also arise and gain significance.
[Click here for full story]

Latest News
EXFO Releases Advanced IPTV Software Package — 11/21/2006
EXFO Launches Compact 10 Gigabit Ethernet Test Solution — 11/1/2006
EXFO Releases New Functionality for Carrier-Grade Ethernet Testing — 10/18/2006
EXFO Releases Next-Gen Cable Assembly and Component Test System — 9/20/2006

Hot tips
Why should I use an optical continuous wave reflectometer (OCWR) when an optical time domain reflectometer (OTDR) can measure back reflection?
What is the minimum distance required to run Ethernet tests using optical fiber on the FTB-8510?
With the CoLT-450, how do I know which Encapsulation type to select?