Home > Library >

Wave Review

Wave Review - EXFO's Technical Newsletter
Up-to-date information about critical issues and the latest advances in optical test and measurement, network monitoring and manufacturing.
February 2005, Volume 11 Number 2
In this issue

Next-Generation SONET/SDH—Simplifying the Lingo
Telecom and acronyms have always gone hand in hand and next-generation SONET/SDH is no exception. Here is a straightforward explanation of basic next-gen terminology, along with notes on associated applications.
[Click here for full story]

Testing with LED Sources
This article reviews the basics of light-emitting diodes—whether they are edge-emitting, surface-emitting, or superluminescent diodes—in specific test and measurement applications.
[Click here for full story]

Latest news
EXFO Introduces Four-Wavelength OTDR for Multimode and Singlemode Fiber
EXFO to Launch All-Band Component Analyzer at OFC/NFOEC 2005
2005 Product Overview catalog now available—order your copy today!
Hot tips
Do we need a high- or low-coherence time LED when using the interferometric method?
What happens to the LED signal when it goes through an EDFA (optical amplifier)?