Home > Library >

Wave Review

Wave Review - EXFO's Technical Newsletter
Up-to-date information about critical issues and the latest advances in optical test and measurement, network monitoring and manufacturing.
August 2004, Volume 10 Number 8
In this issue

Laser Sources, Resolution Bandwidth and Sampling Step
When using a narrowband laser such as a TLS to test a device, the TLS linewidth is usually specified to be as narrow as possible, but how appropriate is this really?
[Click here for full story]

Power Meter Calibration at EXFO
When it comes to calibration, it is not enough to state that an instrument complies with published specifications. At EXFO, a state-of-the-art system is in place to monitor and preserve the quality of all calibrations.
[Click here for full story]

Latest news
Create your own EXFO account—log in to My EXFO today!
Visit our new UV curing website at www.exfo-uv.com.
Watch for our new Fiber Channel Guide—coming soon!
Hot tips